LP/2XCJ-225ATemperature shock test chamber

Purpose

This product is applicable for the safe performance test of electronic components and parts and provides the reliable test and product selection test etc; through the chamber test,（linpin） the product reliability can be improved and the quality control can be conducted.

Chamber Structure

All functions adopt the computer control with good operation interface so as to ensure the user’s operation and monitoring is more simple and straightforward（linpin）.
The cold chamber and hot chamber are controlled independently and the chamber doors are independent of each other so as to enlarge the use range of the test chamber （1 chamber for 3 purposes）（linpin）.
A standard lead hole pipe is installed on the top of the chamber in order to facilitate users to lead sensor cable,（linpin） inspection cable etc into the chamber.

Control System

The switching time between low temperature zone and high temperature zone is not more than 15sec.
The temperature recovery time is not more than 5min.

Standards Applied

GB/T2423.1.2, GB10592-89, GJB150

Specs & Technical Parameters